Library

Library

1991 [NIST]

  • [Publication] “Optical Transmittance Standard Reference Materials for Ultraviolet and Visible Molecular Absorption Spectrometry,” Spectrochimica Acta B (Special Issue on Reference Materials and Methods), Vol. 46B, No. 12, 1653-1662, 1991.
  • [Proceedings] “Technical Status of Optical Filter Standard Reference Materials for UV/VIS Absorption Spectrometers,” Proceedings of the NCSL workshop and Symposium, 1991.
  • [Report] “Experimental Candela Realization with Silicon Photodiodes and Liquid Photopic Filters – Progress Report,” CIE Proceedings, 22nd Session, Vol. 1, Part 1, Division 2 – Physical Measurements of Light and Radiation, 1991.
  • [Poster Presentation] “Time Stability of Optical Transmittance Filters,” Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, Chicago, Illinois USA, March 4, 1991.
  • [Podium Presentation] “Technical Status of Optical Filter Standard Reference Materials for UV/VIS Absorption Spectrometers,” National Conference of Standards Laboratories Workshop and Symposium, Albuquerque, New Mexico USA, August 19‑22, 1991.
  • [Tutorial] “Standardization in UV/VIS Spectrophotometry,” Federation of Analytical Chemistry and Spectroscopy Societies Annual Meeting, FACSS Workshop Program, Anaheim, California USA, October 9, 1991.

1992

  • [Podium Presentation] “Considerations for Certification Renewal of a Liquid Wavelength Standard Reference Material for UV/VIS Spectrophotometry,” Rocky Mountain Conference on Analytical Chemistry, Denver, Colorado USA, August 4, 1992.

1994

  • [Publication] “Standard Reference Materials: Glass Filters as a Standard Reference Material for Spectrophotometry – Selection, Preparation, Certification and Use of SRM 930 and SRM 1930. NIST Special Publication 260‑116, U.S. Government Printing Office, 1994.
  • [Poster Presentation] “Validation of Absorption Spectrophotometers in the Biopharmaceutical Laboratory,” Poster Session, PharmAnalysis Conference, Atlantic City, New Jersey USA, June 20, 1994.
  • [Podium Presentation] “Verification of the Fundamental Parameters of UV/VIS Absorption Spectrophotometers,” North Carolina Section Meeting of the National Conference of Standards Laboratories, Research Triangle Park, North Carolina USA, September 22, 1994.

1997

  • [Podium Presentation] “Calibration Reference Materials and Strategies for UV/VIS Analytical Instrumentation,” ISPE/Carolina Chapter Seminar on Current Calibration Issues in the Pharmaceutical Industry, Raleigh, North Carolina USA, January 13, 1997.
  • [Podium Presentation] “Good Measurement Science Practices for Calibration of UV/VIS Absorption Spectrophotometers,” LA/Orange County/San Diego Section Meeting of the National Conference of Standards Laboratories, Westminster, California USA, April 17, 1997.
  • [Publication] “Calibration and Validation of UV-VIS Absorption Spectrophotometers,” BioPharm, Vol. 10, No. 8, 7, 1997.

1998

  • [Publication] “Reference Material Standardization Guidelines for Quality Control and Validation of UV/VIS Absorption Spectrophotometers,” Cal Lab, Vol. 5, No. 6, 27-33, 1998.
  • [Podium Presentation] “The Important Role of Reference Material Standards in UV/VIS Spectro-Analytical Metrology,” Measurement Science and Measurement Practice Conference, American Society for Quality, Measurement Quality Division, Cambridge, Massachusetts USA, September 15, 1998.
  • [Education] “UV/VIS Reference Material Standardization,” SpectroStandards Analytical Education Workshop, Boulder, Colorado USA, April 21, 1998.
  • [Education] “UV/VIS Reference Material Standardization,” BioPharm Conference Workshop Program, Burlingame, California USA, May 6, 1998.
  • [Podium Presentation] “Introduction to Spectro-Analytical Metrology,” San Diego Biometrology Society,” San Diego, California USA, May 7, 1998.
  • [Education] “UV/VIS Reference Material Standardization,” SpectroStandards Analytical Education Workshop, San Diego, California USA, May 8, 1998.
  • [Poster Presentation] “Reference Material Standardization for Scientifically-Defensible UV Validation,” PDA Annual Meeting, Washington, DC USA, November 10, 1998.
  • [Poster Presentation] “Reference Material Standardization for Credible and Defensible UV/VIS Validation,” ISPE Annual Meeting, Orlando, Florida USA, November 15-19, 1998.
  • [Education] “UV/VIS Reference Material Standardization for Validating Spectrophotometer Specifications,” Varian Seminar on UV/VIS/NIR Analytical Validation Techniques, Dedham, Massachusetts USA, November 20, 1998.

1999

  • [Publication] “A Full-Service UV/VIS Measurement Science Program,” American Laboratory, Vol 31, No. 18, 36-42, 1999.
  • [Poster Presentation] “UV/VIS Reference Material Standardization – A New Biopharmaceutical Analysis and Validation Paradigm,” Symposium on the Analysis of Well Characterized Biotechnology Pharmaceuticals, Washington, DC USA, January 5-8, 1999.
  • [Poster Presentation] “Standardization Considerations for Validation of UV/VIS/NIR Absorption Process Analyzers,” International Forum of Process Analytical Chemistry, San Antonio, Texas USA, January 24-27, 1999.
  • [Poster Presentation] “A New Solid Photometric Reference Material Standard for UV Validation of Absorption Spectrophotometers,” PDA West Coast Chapter Symposium, San Francisco, California USA, April 12-13, 1999.
  • [Poster Presentation] “Standardization Considerations for Meaningful Laboratory Quality Control and Validation of UV Spectrophotometric Data,” International Symposium on Pharmaceutical and Biomedical Analysis, Washington, DC USA, May 9-12, 1999.
  • [Poster Presentation] “Selection and Use of Defensible Reference Material Standards for Calibration, Validation and Qualification of UV/VIS Absorption Spectrophotometers,” Co-Author Andrea Reeves, Rocky Mountain Conference on Analytical Chemistry, Denver, Colorado USA, August 3, 1999.
  • [Education] “New UV/VIS/NIR Photometric Standards for Quality Control and Validation in the Food and Beverage Industries,” Food Quality Conference, San Francisco, California USA, September 14, 1999.
  • [Poster Presentation] “The Role of Spectro-Analytical Metrology in the Pharmaceutical Industry,” PDA Annual Meeting, Washington, DC USA, November 30, 1999.

2000

  • [Proceedings] “Certified Photometric Standard for Quality Control and Validation in UV/VIS Analysis of Lithographic Resist Materials and Processes,” Proceedings of SPIE – The International Society for Optical Engineering, Volume 3999, Advances in Resist Technology and Processing XVII, Francis M. Houlihan, Ed, 646-654, 2000.
  • [Proceedings] “Introduction to Spectro-Analytical Metrology,” Proceedings of the International Conference on Metrology – Trends and Applications in Calibration and Testing Laboratories, 173-178, 2000.
  • [Proceedings] “Traceability Issues for Defensible Open-Loop Certification of UV/VIS/NIR Reference Material Standards,” Proceedings of the NCSL Workshop and Symposium, 2000.
  • [Poster Presentation] “A Certified Photometric Standard for Quality Control and Validation in UV/VIS Spectrophotometric Analysis of Lithographic Resist Materials and Processes,” SPIE’s 25th Annual International Symposium on Microlithography, Santa Clara, California USA, February 28, 2000.
  • [Podium Presentation] “Introduction to Spectro-Analytical Metrology,” International Conference on Metrology – Trends and Applications in Calibration and Testing Laboratories, Jerusalem, ISRAEL, May 17, 2000.
  • [Podium Presentation] “Traceability of Certified Reference Material Standards for Spectro-Analytical Instrument Calibrations,” International Conference on Nutraceuticals and Functional Foods, Houston, Texas USA, September 15, 2000.
  • [Poster Presentation] “Measurement Traceability of Reference Material Standards for UV/VIS Spectroscopic Instrumentation in Analytical Laboratories,” General Analytical Methods Poster, AOAC International Annual Meeting, Philadelphia, Pennsylvania USA, September 12, 2000.
  • [Podium Presentation] “Analytical Accuracy and Traceability of Certified UV/VIS Reference Material Standards,” Calibration & Validation Group Annual Symposium, Mississauga, Ontario, CANADA, September 28, 2000.
  • [Education] “Traceability of Instrument Validation Standards for UV/VIS Measurements in the Food Industry,” Food Quality Conference, Philadelphia, Pennsylvania USA, October 4, 2000.

2001

  • [Education] “Improving Laboratory Efficiency with Compliant Spectro-Analytical Instrument Calibrations,” Interphex Conference, Seminar Session, Philadelphia, Pennsylvania USA, March 20, 2001.
  • [Poster Presentation] “Traceability of Certified Reference Materials for UV/VIS Instrument Calibrations,” Co-Author Kathy McLain, Pharmaceutical Quality Session: Analytical, AAPS Pharmaceutical Congress of the Americas, Orlando, Florida USA, March 26-27, 2001.
  • [Podium Presentation] “Overview of Primary Reference Materials for Molecular Absorption Spectrophotometry in the United States,” 4th Oxford Conference on Spectrometry – Color and Appearance: Fluorescence, Standards, and Display Metrology in the New Millennium,” Davidson College, Davidson, North Carolina USA, June 10, 2002.
  • [Education] “Spectro-Analytical Instrument Calibration,” 60th Chemical Conference and & 9th Caribbean Environmental Chemical Conference, Continuing Education Session, Rio Grande, PR, August 8, 2001.
  • [Podium Presentation] “Traceability in Spectro-Analytical Instrument Calibrations,” American Chemical Society Midwest Regional Meeting, Lincoln, Nebraska USA, October 11, 2001.

2002

  • [Proceedings] “Overview of Primary Reference Materials for Molecular Absorption Spectrophotometry in the United States,” Proceedings of SPIE – The International Society for Optical Engineering, 4th Oxford Conference on Spectrometry – Color and Appearance: Fluorescence, Standards, and Display Metrology in the New Millennium,” 2002.
  • [Poster Presentation] “Science-Based Qualification of Analytical Laboratory Instrumentation,” Quality Assurance and Accreditation Session, AOAC International Annual Meeting, Los Angeles, California USA, September 25, 2002.

2003

  • [Poster Presentation] “Historical Review of Standard Reference Materials for Analytical Spectrophotometry – A Tribute to Dr. Radu Mavrodineanu,” Federation of Analytical Chemistry and Spectroscopy Societies Annual Meeting, Fort Lauderdale, Florida USA, October 19, 2003.

2004

  • [Poster Presentation] “A Wavelength and Resolution Test Reference Material Artifact for Short-Wave Near-Infrared Absorption Spectrophotometry,” Quality Assurance and Accreditation Session, AOAC International Annual Meeting, Saint Louis, Missouri USA, September 22, 2004. 

2005

  • [Poster Presentation] “Introduction to Analytical Metrology,” Data Manipulation, Quality, and Validation Poster Session, Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, Orlando, Florida USA, March 1, 2005.
  • [Poster Presentation] “Analytical Metrology Perspective of Spectral Bandpass in UV/VIS/NIR Spectrophotometry,” Division of Analytical Chemistry, General Papers Session – Spectroscopy, American Chemical Society National Meeting, San Diego, California USA, March 13, 2005.
  • [Poster Presentation] “Calibration Reference Material Artifacts for Spectrophotometric Validation of Dynamic Absorbance Measurements,” Analytical Session, AOCS Annual Meeting, Salt Lake City, Utah USA, May 3, 2005.
  • [Poster Presentation] “Reference Material Artifacts for Calibration and Quality Control of Molecular Absorption Spectrophotometers,” American Society of Brewing Chemists Annual Meeting, Savannah, Georgia USA, June 13-14, 2005.
  • [Education] “Science-Based Calibration of UV/VIS Spectrophotometers,” SAMEP [C-0101]; Hawthorn Suites at Desert Rose Resort; Las Vegas, Nevada USA, November 18, 2005.

2006

  • [Education] “UV/VIS Absorption Spectrophotometer Calibration and Traceability,” SAMEP [C-01A06]; Stranaska Analytical Metrology Learning Lab, Fort Collins, Colorado USA, August 24-26, 2006.

2007

  • [Publication] “Stranaska Contributions to Metrology in Chemistry,” CITAC News, February, 14-16, 2007.
  • [Education] “Analytical Chemistry for Metrologists,” SAMEP [C-02A07]; Measurement Science Conference Tutorial Workshop Program, Long Beach, California USA, January 23, 2007.
  • [Podium Presentation] “Examining Certified Reference Material Artifacts for Analytical Metrology,” SWE Enterprises Conference on Preventive, Predictive and Scheduled Maintenance Calibration Management, San Diego, California, USA, March 9, 2007.
  • [Podium Presentation] “The Legacy of Radu Mavrodineanu,” Arranged Symposium (Commemoration of Dr. Radu Mavrodineanu), Federation of Analytical Chemistry and Spectroscopy Societies / Society for Applied Spectroscopy National Meeting, Memphis, Tennessee USA, October 18, 2007.
  • [Education] “UV/VIS Absorption Spectrophotometer Calibration and Traceability,” SAMEP [C-00A07]; Stranaska Analytical Metrology Learning Lab, Fort Collins, Colorado USA, October 25-26, 2007.
  • [Education] “UV/VIS Absorption Spectrophotometer Calibration and Traceability,” SAMEP [C-00B07]; Stranaska Analytical Metrology Learning Lab, Fort Collins, Colorado USA, November 29-30, 2007.
  • [Poster Presentation] “Metal-on-Quartz Transmittance Filters for UV/VIS Spectrophotometry,” Spectroscopy Session, Eastern Analytical Symposium, Somerset, New Jersey, USA, November 14, 2007.
  • [Poster Presentation] “Metrological Calibration of Absorbance Microplate Spectrophotometers,” Spectroscopy Session, Eastern Analytical Symposium, Somerset, New Jersey, USA, November 14, 2007.

2008

  • [Education] “Metrology for Laboratory Analysts,” SAMEP [C-03A08]; Pittsburgh Conference Short Course Program, New Orleans, Louisiana USA, March 6, 2008.
  • [Education] “Analytical Chemistry for Metrologists,” SAMEP [C-02A08]; Measurement Science Conference Tutorial Workshop Program, Anaheim, California USA, March 11, 2008.
  • [Education] “UV/VIS Absorption Spectrophotometer Calibration and Traceability,” SAMEP [C-01A08]; Stranaska Analytical Metrology Learning Lab, Fort Collins, Colorado USA, July 21-23, 2008.

2009

  • [Education] “Metrology in the Analytical Laboratory,” SAMEP [C-03A09]; Pittsburgh Conference Short Course Program, Chicago, Illinois USA, March 12, 2009.
  • [Education] “Analytical Chemistry for Metrologists,” SAMEP [C-02A09]; Measurement Science Conference Tutorial Workshop Program, Anaheim, California USA, March 24, 2009.
  • [Education] “UV/VIS Absorption Spectrophotometer Standardization,” Product Seminar, SAMEP [S-01A09]; San Ramon, California USA, May 29, 2009.
  • [Education] “UV/VIS Absorption Spectrophotometer Metrology,” SAMEP [C-01A09]; Genmab MN (Host), Brooklyn Park, Minnesota USA, September 22, 2009.
  • [Podium Presentation] “Analytical Metrology,” NCSLI Twin Cities Section Meeting; Boston Scientific, Maple Grove, Minnesota, USA, September 23, 2009.
  • [Education] “Metrology in the Analytical Laboratory,” SAMEP [C-03B09]; Eastern Analytical Symposium Short Course Program, Somerset, New Jersey USA, November 15, 2009.

2010

  • [Podium Presentation] “Metrological Considerations for Standardization in Absorbance Microplate Calibrations,” ISRANALYTICA 2010 Conference – Israel Analytical Chemistry Society Annual Meeting; Tel Aviv, ISRAEL, January 20, 2010.
  • [Education] “Metrological Traceability in Analytical Spectrophotometric Instrument Qualification,” CITAC Workshop Tutorial; Weizmann Science Park, Ness Ziona ISRAEL, January 21, 2010.
  • [Poster Presentation] “Metrological Considerations for Recertification of Spectrophotometer Standard Filters,” Co-Authors Aaron Dickson and Stephanie Guthrie, Advances in UV-Vis Spectroscopy Poster Section, Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, Orlando, Florida USA, March 2, 2010.
  • [Poster Presentation] “Qualification of a Reference Spectrophotometer for Absorbance Microplate Certification,” Co-Authors Stephanie Guthrie and Aaron Dickson, Advances in UV-Vis Spectroscopy Poster Section, Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, Orlando, Florida USA, March 2, 2010.
  • [Education] “Metrology in the Analytical Laboratory,” SAMEP [C-03A10]; Pittsburgh Conference Short Course Program, Orlando, Florida USA, March 3, 2010.
  • [Podium Presentation] “The Forensic Analysis Laboratory: Metrology,” Biennial Conference on Chemical Education, Division of Chemical Education, American Chemical Society, Symposium on Educating Future Forensic Scientists, University of North Texas, Denton, Texas USA, August 3, 2010.

2012

  • [Podium Presentation] “Metrology in Forensic Quantitative Analysis,” Biennial Conference on Chemical Education, Division of Chemical Education, American Chemical Society, Symposium on Innovative Forensic Applications for Teaching with an Emphasis on Chemical Principles, Part II – Upper Level College Programs, The Pennsylvania State University, State College, Pennsylvania USA, August 2, 2012.
  • [Education] “Analytical UV/VIS Absorption Spectrophotometer Metrology,” SAMEP [C-01A12]; Raphael Hotel, Kansas City, Missouri USA, October 3, 2012.
  • [Poster Presentation] “Use of Intrinsic Data for Certification and Renewal of Holmium Oxide Solution Wavelength Measurement Standards,” Co-Authors Aaron Dickson and Stephanie Guthrie, American Chemical Society Rocky Mountain Regional Meeting, General Poster Session, Westminster, Colorado USA, October 18, 2012.

2013

  • [Poster Presentation] “Scientific Performance Evaluation and Qualification of Analytical Ultraviolet-Visible Spectrophotometers,” American Chemical Society 245th National Meeting, Division of Analytical Chemistry General Poster Session, New Orleans, Louisiana USA, April 7, 2013.
  • [Podium Presentation] “Analytical Metrology in the Legal-Forensic World: Overcoming Barriers to the Acceptance of Metrology,” American Chemical Society 245th National Meeting, Division of Chemistry and the Law [CHAL] Session – The Importance and Evidentiary Ramifications of Reducing Error in Forensic Analytical Chemistry: Metrology in the Courtroom [Invited], New Orleans, Louisiana USA, April 10, 2013.
  • [Podium Presentation] “Metrology in Quantitative Forensic Chemical Analysis,” American Chemical Society 245th National Meeting, Division of Chemistry and the Law [CHAL] Session – The Many Faces of CHAL: Where Chemistry Meets the Law, New Orleans, Louisiana USA, April 11, 2013.
  • [Podium Presentation] “Measurement Uncertainty in Quantitative Forensic Chemical Analysis,” American Chemical Society Northeast Regional Meeting, Symposium: Forensic Analytical Chemistry, New Haven, Connecticut USA, October 25, 2013.

2014

  • [Podium Presentation] “Metrological Qualification of Spectrophotometers for Successful Analytical Method Transfer,” American Chemical Society 248th National Meeting, Division of Chemical Education Session – Teaching Analytical Method Transfer, San Francisco, California USA, August 13, 2014.
  • [Podium Presentation] “Chemical Metrology and Forensic Science in the Courtroom,” American Chemical Society 248th National Meeting, Division of Chemistry and the Law [CHAL] Session – The Many Faces of CHAL: Where Chemistry Meets the Law, San Francisco, California USA, August 15, 2014.

2015

  • [Education] “Analytical UV/VIS Absorption Spectrophotometer Metrology,” SAMEP [C-01A15]; Catal Restaurant Downtown Disney, Anaheim, California USA, March 18, 2015.
  • [Poster Presentation] “Mathematical Models for Quantitative Spectrophotometric Spectral Bandwidth Measurements,” Co-authors Alex Reid and Melissa Labrie, 249th National Meeting, Division of Analytical Chemistry General Poster Session, American Chemical Society Denver, Colorado USA, March 24, 2015.
  • [Poster Presentation] “Metrological Evaluation of a Potential Certification Bias for Potassium Dichromate Solution Measurement Standards,” Co-authors Melissa Labrie and Alex Reid, Division of Analytical Chemistry General Poster Session, American Chemical Society 249th National Meeting, Denver, Colorado USA, March 24, 2015.
  • [Education] “Analytical Forensic Metrology,” SAMEP [C-AFM150916]; Broward Sheriff’s Office Crime Laboratory, Chemistry Drug Unit, Fort Lauderdale, Florida USA, September 16-18, 2015.
  • [Podium Presentation] “Analytical Forensic Metrology,” 4th International Conference on Forensic Research & Technology, Forensic Chemistry Session, Atlanta, Georgia USA, September 29, 2015.
  • [Podium Presentation] “Metrological Qualification of Molecular Spectrometric Instrumentation Used for Forensic Laboratory Analysis and Testing of Trace Evidence,” Southern Association of Forensic Scientists / American Society of Trace Evidence Examiners,” Atlanta, Georgia USA, October 16, 2015.
  • [Podium Presentation] “Metrological Qualification of Molecular Spectrometric Instrumentation Used for Forensic Laboratory Analysis and Chemical Testing of Drugs,” Southern Association of Forensic Scientists / American Society of Trace Evidence Examiners,” Atlanta, Georgia USA, October 16, 2015.
  • [Education] “Analytical Forensic Metrology,” SWAFS 2015, Workshop Program, Southwestern Association of Forensic Scientists Conference, Oklahoma City, Oklahoma USA, October 18, 2015.

2016

  • [Education] “Analytical Forensic Metrology,” NCSLI International Workshop & Symposium, Tutorial Program, Saint Paul, Minnesota USA, July 24, 2016.