METROLOGY R&D

Stranaska Scientific strives for state-of-the-art science in all areas of analytical metrology that it practices. Specifically, in the field of analytical UV/VIS spectrophotometric metrology, we are investigating ways to continually improve our understanding of the metrological concepts that can result in procedural upgrades in our laboratory customer services. Our analytical spectrophotometric metrology R&D projects include, but are not limited to, the following:

  • Metrological traceability – pathway identifications
  • Measurement uncertainty – mathematical treatments
  • Reference materials – new artifacts and scopes of calibration 
  • Commercial instrument validation software – functionality evaluation and scientific defensibility
  • Microplate recertifications – scopes of calibration
  • Instrument calibrations archival – data mining
  • Spectrophotometer sampling configurations – qualification challenges
    • Dynamic sampling – continuous flow
    • Remote sampling – fiber optic probes
  • Spectrophotometer designs – transfer higher-order instrument operations

 

 

 

 

 

 

 

 

 

 

 

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