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Simply stated, analytical metrology is best described as measurement-centric chemistry (MCC), a new emerging discipline of chemical science. The term ‘analytical metrology’ was first coined more than 25 years ago by Dr. Jerry Messman, the founder and current managing director of Stranaska Scientific LLC, to reflect the overlap of analytical measurements and metrology in science and engineering. Regarded as a new hybrid science, analytical metrology bridges two separate disciplines: analytical chemistry and traditional metrology. Encompassing the realm of metrology in chemistry, analytical metrology provides a broadened perspective and state-of-the-art treatment of qualitative and quantitative chemical analysis.

Analytical Metrology – A New and Engaging STEM Subject

Scientific measurement and metrology play an important integral role especially in analytical chemistry as it applies to fundamental and applied research studies and chemical testing around the world. The need for accurate and valid scientific analytical measurements becomes intuitively obvious to the typical consumer when considering the ramification of the results of testing throughout our society: testing of clinical specimens (blood draws and diagnostics), forensic evidence (gunshot residue), roadside breath alcohol and drug scenarios, environmental sampling (fracking and greenhouse gases), food safety, nutritional label information, safety and health dangers of vaping, and many other examples.

Providing awareness of new scientific topics and applications is the first step in opening the door to new unexplored career paths and workplace opportunities for high school and post-secondary science students. Despite the fact that analytical metrology is integral to many disciplines in the real-world scientific workplace, inexplicably, it is not included as part of the STEM curricula taught in most high schools and colleges in the United States. The inclusion of analytical metrology as a new STEM subject represents an important step moving forward.

Analytical Metrology and the Periodic Table

Chemistry students may find their studies of the Periodic Table somewhat boring with a sense of skepticism of its real-world relevance. However, analytical metrology is strongly connected to the tabular display of the chemical elements. The arrangement of the elements by atomic number, electron configuration, and recurring chemical properties helps explain the basis and understanding of the theoretical principles and concepts of most analytical methods of chemical analysis.

For example, bonding orbitals and patterns underpin spectrochemical analysis – both atomic spectrometry and molecular spectrometry. Oxidation states provide a basis for electroanalytical measurements and also speciation analysis. Isotopes can be studied through mass spectrometry. Vapor pressure and polarity are the basis of distinctive methods of separation and chemical analysis using chromatography. Thermodynamic properties underpin calorimetry and combustion methods of analysis.

The SAMEC™ Experience

The educational vision of SAMEC™ is to be a national leader in promoting analytical metrology throughout the United States and the rest of the world. A primary goal is to integrate analytical metrology into all chemistry courses, or to include analytical metrology as a standalone course, in chemistry and other STEM curricula for high schools and colleges. Education of students, teachers and industry professionals in analytical metrology is realized through SAMEC™ which provides the specialized science training built upon a real-world work experience model. As such, SAMEC™ helps prepare high school and post-secondary science and other STEM students for advanced college and workplace job opportunities that would otherwise be relatively unknown.

Introducing analytical metrology to local high school and post-secondary students through SAMEC™ classes is the company’s initial grassroots effort to fulfill its bold vision. The eventual goal of SAMEC™ is to use the initial grassroots effort as a springboard for mounting a national campaign to educate high school and post-secondary students in analytical metrology throughout the United States.